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उत्पाद विवरण:
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| माप श्रेणी: | 0.01μSv/h~500μSv/h | ऊर्जा प्रतिक्रिया: | 40Kev～3Mev |
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| संवेदनशीलता: | 350cps/ μSv/h | सापेक्ष त्रुटि, अधिक नहीं: | ± 15% |
| प्रमुखता देना: | NaI scintillation radiation detector,high sensitivity gamma probe,X gamma radiation monitoring |
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FJ-3025 High Sensitivity X Gamma Radiation Monitoring Probe NaI Scintillation Detector
Features:
Real-time measurement of γ and X-ray radiation in the workplace
Features a 485 communication interface and supports Modbus protocol
Compatible with host control equipment or upper-level monitoring software
High-sensitivity NaI scintillator detector
Technical Specifications
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Measurement range |
0.01μSv/h～500μSv/h |
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Energy response |
40keV～3MeV |
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Sensitivity |
350cps/ μSv/h |
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Relative error, not more |
±15% |
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Response time |
≤1s(10μSv/h) |
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Operating temperature range |
-20℃～+50℃ |
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Relative humidity |
≤98％ |
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Supply voltage |
DC 7V～24V |
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Static power consumption |
12V/ 5mA |
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Dimensions |
Diameter 45mm, Length 120mm (excluding plug height) |
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Weight |
0.6kg |
Delivery kit:
Probe, data communication protocol or specialized data analysis software
व्यक्ति से संपर्क करें: Ms. Shifen Yuan
दूरभाष: 8610 82921131,8618610328618
फैक्स: 86-10-82916893
Hindi
